Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Product Description:

The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface analysis by allowing complete freedom of movement across the sample in all three spatial dimensions. This capability ensures high-resolution imaging and detailed characterization of complex sample topographies, making it an indispensable tool for researchers and engineers working in nanotechnology, materials science, and semiconductor industries.

One of the standout features of this AFM is its multifunctional measurement capabilities. It integrates several specialized microscopy techniques within a single platform, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM). These functionalities allow users to investigate a wide range of physical properties such as surface charge distribution, electric potential variations, piezoelectric responses, capacitance changes, and magnetic domain structures. Additionally, there is an optional module for Conductive Atomic Force Microscopy (C-AFM), which further expands the system’s functionality by enabling current mapping and electrical conductivity measurements at the nanoscale.

The imaging performance of this AFM is exceptional, supporting image sampling points ranging from 32*32 up to 4096*4096. This extensive range allows for flexible imaging resolutions tailored to the specific requirements of different applications, from quick overview scans to ultra-high-resolution detailed analyses. The high sampling density ensures that even the finest surface features can be captured with remarkable clarity and accuracy.

Maintaining ultra-low noise levels is critical in AFM operation to achieve precise surface measurements, and this system excels in this regard with a Z-axis noise level as low as 0.04 nm. Such minimal noise interference guarantees that vertical displacement measurements are highly accurate, contributing to the reliability and reproducibility of the data collected. This is particularly important for non-contact AFM modes, where the tip-sample interaction forces are extremely delicate and sensitive to environmental disturbances.

The AFM also features a scanning angle range of 0 to 360 degrees, offering complete rotational freedom during imaging and analysis. This full angular capability allows users to orient and examine samples from any direction, facilitating comprehensive surface characterization and enabling the study of anisotropic properties or directional phenomena without the need to reposition the sample manually.

As a non-contact AFM, this system minimizes tip wear and sample damage by operating without physically touching the surface during measurements. This mode is ideal for analyzing soft, delicate, or easily deformed materials, preserving their integrity while still providing detailed nanoscale information. The combination of non-contact operation with multifunctional measurement modes makes this AFM a versatile and powerful tool for a broad spectrum of scientific investigations.

In summary, this all-in-one AFM offers a robust solution for high-precision nanoscale imaging and multifunctional property measurements. Its XYZ three-axis full-sample scanning method, extensive suite of integrated microscopy techniques, high-resolution imaging capabilities, ultra-low Z-axis noise level, and full 360-degree scanning angle make it a state-of-the-art instrument tailored for advanced research and industrial applications. Whether you are studying electrical, magnetic, mechanical, or piezoelectric properties at the nanoscale, this AFM system provides the performance and flexibility needed to push the boundaries of scientific discovery.

Features:

• Product Name: Atomic Force Microscope (All-in-One AFM)
• Z-Axis Noise Level: 0.04 Nm for high precision measurements
• Multifunctional Measurements including Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Scanning Capacitive Atomic Force Microscope (SCM), Magnetic Force Microscope (MFM)
• Optional Conductive Atomic Force Microscope (C-AFM) mode available
• Scanning Angle: 0~360° for versatile sample analysis
• Scanning Rate: 0.1 Hz to 30 Hz to accommodate various imaging speeds
• Scanning Method: XYZ Three-Axis Full-Sample Scanning ensuring comprehensive surface characterization
• Serves as a Nanoscale Characterization Platform with Multi-Mode Measurement capabilities

Technical Parameters:

Applications:

The Truth Instruments AtomEdge Pro Atomic Force Microscope (AFM), originating from China, is a state-of-the-art scientific instrument designed to provide atomic resolution imaging and nanomechanical testing capabilities. Its advanced scanning rate ranging from 0.1 Hz to 30 Hz and a full 0~360° scanning angle enable highly precise and flexible sample analysis. The AtomEdge Pro is compatible with samples up to 25 mm in diameter, making it suitable for a wide variety of research and industrial applications.

This versatile AFM model excels in multifunctional measurements, offering Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM). Additionally, it supports optional Conductive Atomic Force Microscopy (C-AFM), making it ideal for in-depth electrical property analysis. These features make the AtomEdge Pro highly suitable for research environments focusing on material science, semiconductor technology, and nanotechnology development.

In academic and industrial laboratories, the AtomEdge Pro is often utilized for nanomechanical testing, allowing scientists to explore mechanical properties at the nanoscale with exceptional accuracy. Its low nonlinearity in the XY direction (0.02%) and Z direction (0.08%) ensures reliable and reproducible measurements, critical for high-precision applications such as biomaterials research, polymer analysis, and surface engineering. The atomic resolution imaging capability enables detailed surface characterization, essential for developing new materials and improving manufacturing processes.

The AFM's multifunctional measurement options and adaptability make it equally valuable in electronics, where detailed surface potential and magnetic property mapping are necessary. For instance, the KPFM and EFM modes facilitate the study of charge distribution and electrostatic forces on microelectronic components, aiding in device optimization and failure analysis. Meanwhile, PFM and MFM modes support investigations into piezoelectric and magnetic materials, contributing to advancements in sensors and memory devices.

Overall, the Truth Instruments AtomEdge Pro Atomic Force Microscope is a powerful and flexible tool designed for a broad range of application scenarios—from fundamental research in nanoscience to practical applications in industry. Its combination of atomic resolution, multifunctional measurement capabilities, and robust design ensures it meets the demanding needs of modern nanomechanical testing and surface characterization tasks.